JEQ -- Index by Author (Sep 2007; Volume 36, Number 5)

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Index by Author: Sep 2007; 36 (5) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Anderson, A. J. [Abstract] [Full Text]; Angle, J. Scott [Abstract] [Full Text]; Annable, Michael D. [Abstract] [Full Text]
B: Bae, Gwang-Ok [Abstract] [Full Text]; Baird, Andrew J. [Abstract] [Full Text]; Ball, William P. [Abstract] [Full Text]; Ball, William P. [Full Text]; Bastiaens, Leen [Abstract] [Full Text]; Bednarz, C.W. [Abstract] [Full Text]; Belkessam, L. [Abstract] [Full Text]; Biryukova, O. [Abstract] [Full Text]; Bosch, D.D. [Abstract] [Full Text]; Bosch, David D. [Abstract] [Full Text]; Bouwer, Edward J. [Abstract] [Full Text]; Bowman, Dwight D. [Abstract] [Full Text]; Brabander, Daniel [Abstract] [Full Text]; Bradford, S. A. [Abstract] [Full Text]; Brandt, Robin [Abstract] [Full Text]; Broadhurst, C. Leigh [Abstract] [Full Text]; Burnett, Aaron [Abstract] [Full Text]
C: Casson, Janna P. [Abstract] [Full Text]; Castro, Ana [Abstract] [Full Text]; Chaney, Rufus L. [Abstract] [Full Text]; Chartrand, Shawna [Abstract] [Full Text]; Child, R. [Abstract] [Full Text]; Cho, Jaehyun [Abstract] [Full Text]; Collick, Amy S. [Abstract] [Full Text]; Crouse, D. A. [Abstract] [Full Text]
D: Denys, S. [Abstract] [Full Text]; Dou, Zhengxia [Abstract] [Full Text]; DuTeau, Nancy M. [Abstract] [Full Text]
E: Eklind, Ylva [Abstract] [Full Text]; Elliott, Herschel [Abstract] [Full Text]
F: Franklin, D.H. [Abstract] [Full Text]; Frick, Walter E. [Abstract] [Full Text]
G: Ge, Zhongfu [Abstract] [Full Text]; Gentry, Randall W. [Abstract] [Full Text]; Glenn, Edward P. [Abstract] [Full Text]
H: Harmsen, Joop [Abstract] [Full Text]; Hatfield, Kirk [Abstract] [Full Text]; Haws, Nathan W. [Abstract] [Full Text]; Heathwaite, A. L. [Abstract] [Full Text]; Henderson, David A. [Abstract] [Full Text]; Hodges, S. C. [Abstract] [Full Text]; Horppila, Jukka [Abstract] [Full Text]; Hunt, P. G. [Abstract] [Full Text]; Hyun, Yunjung [Abstract] [Full Text]
I: Inglis, Scott [Abstract] [Full Text]; Iverson, Sadie L. [Abstract] [Full Text]
J: Jawitz, James W. [Abstract] [Full Text]; Jaynes, D.B. [Abstract] [Full Text]; Joern, Mark [Abstract] [Full Text]; Jönsson, Håkan [Abstract] [Full Text]; Joo, Hyun [Abstract] [Full Text]
K: Kaown, Dugin [Abstract] [Full Text]; Kaspar, T.C. [Abstract] [Full Text]; Kelliher, Francis M. [Abstract] [Full Text]; Kirchmann, Holger [Abstract] [Full Text]; Kleinman, Peter [Abstract] [Full Text]; Koger, Clifford H., III [Abstract] [Full Text]; Koirala, Shesh R. [Abstract] [Full Text]; Kovar, John [Abstract] [Full Text]; Krutz, L. Jason [Abstract] [Full Text]; Kurtz, Andrew C. [Abstract] [Full Text]
L: Layton, Alice C. [Abstract] [Full Text]; Lee, Kang-Kun [Abstract] [Full Text]; Leytem, April [Abstract] [Full Text]; Li, Zheng [Abstract] [Full Text]; Liang, Y. [Abstract] [Full Text]; Little, Joanne L. [Abstract] [Full Text]; Locke, Martin A. [Abstract] [Full Text]
M: MacKenzie, M. D. [Abstract] [Full Text]; Maguire, R. O. [Abstract] [Full Text]; Maguire, Rory [Abstract] [Full Text]; Maier, Raina M. [Abstract] [Full Text]; Matheny, T. A. [Abstract] [Full Text]; Matthews, D. I. [Abstract] [Full Text]; McCarthy, John F. [Abstract] [Full Text]; McDowell, R. W. [Abstract] [Full Text]; McDowell, R.W. [Abstract] [Full Text]; McKay, Larry D. [Abstract] [Full Text]; McKeon, Casey [Abstract] [Full Text]; McMillan, R. [Abstract] [Full Text]; Miller, C. D. [Abstract] [Full Text]; Moore, Philip [Abstract] [Full Text]; Moorman, T.B. [Abstract] [Full Text]; Muñoz-Carpena, Rafael [Abstract] [Full Text]
N: Nash, D. M. [Abstract] [Full Text]; Nevers, Meredith B. [Abstract] [Full Text]; Niemistö, Juha P. [Abstract] [Full Text]; Niqui-Arroyo, José-Luis [Abstract] [Full Text]; Nolan, Sheilah C. [Abstract] [Full Text]
O: Obbard, Jeffrey P. [Full Text]; Olson, Barry M. [Abstract] [Full Text]; Olson, Paul E. [Abstract] [Full Text]; Ortega-Calvo, José-Julio [Abstract] [Full Text]; Ortega-Calvo, José-Julio [Full Text]; Ortega-Calvo, Jose-Julio [Abstract] [Full Text]
P: Papadopoulos, Apostolos [Abstract] [Full Text]; Parkin, T.B. [Abstract] [Full Text]; Perrin-Ganier, C. [Abstract] [Full Text]; Peters, Carinne A. [Abstract] [Full Text]; Pilon-Smits, Elizabeth A. H. [Abstract] [Full Text]; Potter, T.L. [Abstract] [Full Text]; Potter, Thomas L. [Abstract] [Full Text]; Presley, DeAnn [Full Text]
Q: Quideau, S. A. [Abstract] [Full Text]
R: Reardon, Kenneth F. [Abstract] [Full Text]; Reid, Brian J. [Abstract] [Full Text]; Ro, K. S. [Abstract] [Full Text]; Robertson, F. [Abstract] [Full Text]; Rosario, Karyna [Abstract] [Full Text]
S: Saporito, Lou [Abstract] [Full Text]; Sayler, Gary S. [Abstract] [Full Text]; Schaffer, Bruce [Abstract] [Full Text]; Schiavon, M. [Abstract] [Full Text]; Schulin, Rainer [Full Text]; Selim, H.M. [Abstract] [Full Text]; Semple, Kirk T. [Full Text]; Semple, Kirk T. [Abstract] [Full Text]; Shailer, Mark [Abstract] [Full Text]; Sharpley, Andrew [Abstract] [Full Text]; Shober, Amy [Abstract] [Full Text]; Sims, R. C. [Abstract] [Full Text]; Sims, Tom [Abstract] [Full Text]; Smårs, Sven [Abstract] [Full Text]; Smith, R. V. [Abstract] [Full Text]; Sparks, Donald L. [Abstract] [Full Text]; Spoden, Astrid [Abstract] [Full Text]; Springael, Dirk [Abstract] [Full Text]; Steenhuis, Tammo S. [Abstract] [Full Text]; Steger, Kristin [Abstract] [Full Text]; Steinriede, Robert W., Jr. [Abstract] [Full Text]; Strickland, T.C. [Abstract] [Full Text]; Sullivan, Dan [Abstract] [Full Text]; Sundberg, Cecilia [Abstract] [Full Text]; Sundh, Ingvar [Abstract] [Full Text]; Surridge, Ben W. J. [Abstract] [Full Text]
T: Tappero, Ryan V. [Abstract] [Full Text]; Toor, Gurpal [Abstract] [Full Text]; Toride, N. [Abstract] [Full Text]; Toth, John [Abstract] [Full Text]; Truman, C.C. [Abstract] [Full Text]
U: Udeigwe, Theophilus K. [Abstract] [Full Text]; Uyttebroek, Maarten [Abstract] [Full Text]
V: Vessigaud, S. [Abstract] [Full Text]
W: Walters, Daniel T. [Abstract] [Full Text]; Wang, Jim J. [Abstract] [Full Text]; Watson, C. J. [Abstract] [Full Text]; Wattiau, Pierre [Abstract] [Full Text]; Whitman, Richard L. [Abstract] [Full Text]; Wick, Lukas Y. [Full Text]; Williams, Dan E. [Abstract] [Full Text]; Woche, S.K. [Full Text]; Wolf, Ann [Abstract] [Full Text]; Wortmann, Charles S. [Abstract] [Full Text]; Wouters, Katinka [Abstract] [Full Text]; Wright, Peter [Abstract] [Full Text]
Z: Zartman, Richard E. [Full Text]; Zhang, Hailin [Abstract] [Full Text]; Zhang, Hailin [Abstract] [Full Text]; Zhang, Hua [Abstract] [Full Text]; Zhang, Tiequan [Abstract] [Full Text]

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