JEQ -- Index by Author (July-August 1998; Volume 27, Number 4)

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Index by Author: July-August 1998; 27 (4) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Adani, Fabrizio [Abstract] [PDF]; Alva, A.K. [Abstract] [PDF]; Amador, José A. [Abstract] [PDF]; Amatya, D. M. [Abstract] [PDF]; Aparicio-Tejo, P. M. [Abstract] [PDF]; Ashbaugh, Lowell [Abstract] [PDF]; Ashbaugh, Lowell [Abstract] [PDF]
B: Bainbridge, David [Abstract] [PDF]; Baker, J. L. [Abstract] [PDF]; Barbarick, K. A. [Abstract] [PDF]; Barbarick, K. A. [Abstract] [PDF]; Baron, Dirk [Abstract] [PDF]; Barten, Paul K. [Abstract] [PDF]; Beltrami, P. [Abstract] [PDF]; Blank, R. R. [Abstract] [PDF]; Bouma, J. [Abstract] [PDF]; Boyd, Stephen A. [Abstract] [PDF]; Briggs, J. A. [Abstract] [PDF]; Brobst, R.B. [Abstract] [PDF]; Bundrick, Charles M. [Abstract] [PDF]
C: Cambardella, C. [Abstract] [PDF]; Campbell, R. G. [Abstract] [PDF]; Campbell, Rich [Abstract] [PDF]; Campbell, Rich [Abstract] [PDF]; Centner, Terence J. [Abstract] [PDF]; Chappelka, A. H. [Abstract] [PDF]; Chefetz, Benny [Abstract] [PDF]; Chen, Yona [Abstract] [PDF]; Clegg, B. S. [Abstract] [PDF]; Cohen, Y. [Abstract] [PDF]
D: David, Mark B. [Abstract] [PDF]
E: Ernstsen, Vibeke [Abstract] [PDF]
F: Farber, Robert J. [Abstract] [PDF]; Farber, Robert J. [Abstract] [PDF]; Fenelon, J. M. [Abstract] [PDF]; Feng, Jinan [Abstract] [PDF]; Filby, Royston H. [Abstract] [PDF]; First, Paul R. [Abstract] [PDF]; Flemer, David A. [Abstract] [PDF]; Frankenberger, W. T., Jr. [Abstract] [PDF]; Frankenberger, William T., Jr. [Abstract] [PDF]; Fraser, Robert H. [Abstract] [PDF]
G: Gan, J. [PDF]; Garty, J. [Abstract] [PDF]; Gates, Will P. [Abstract] [PDF]; Genevini, Pierluigi [Abstract] [PDF]; Gentry, Lowell E. [Abstract] [PDF]; Gilliam, J. W. [Abstract] [PDF]; Görres, Josef H. [Abstract] [PDF]; Graham, W.D. [Abstract] [PDF]; Grantz, David A. [Abstract] [PDF]; Grantz, David A. [Abstract] [PDF]
H: Hadar, Yitzhak [Abstract] [PDF]; Hegeman, P. [Abstract] [PDF]; Hering, Janet G. [Abstract] [PDF]; Herman, David C. [Abstract] [PDF]; Horton, R. [Abstract] [PDF]; Hsieh, Yuch Ping [Abstract] [PDF]
I: Ippolito, J. A. [Abstract] [PDF]
J: Jui, P. Y. [Abstract] [PDF]; Jui, P. Y. [Abstract] [PDF]; Jury, W. A. [Abstract] [PDF]; Jury, W.A. [PDF]
K: Kanwar, R. S. [Abstract] [PDF]; Kaspar, T. C. [Abstract] [PDF]; Kim, Bong [Abstract] [PDF]; Kim, Bong [Abstract] [PDF]; Kim, J.S. [Abstract] [PDF]; Kloog, N. [Abstract] [PDF]; Kovacic, David A. [Abstract] [PDF]
L: Lamsfus, C. [Abstract] [PDF]; Lasa, B. [Abstract] [PDF]; Lebo, M. E. [Abstract] [PDF]; Logan, Terry J. [PDF]; Lores, Emile M. [Abstract] [PDF]; Losi, M. E. [Abstract] [PDF]; Lyons, Jodi B. [Abstract] [PDF]
M: Marcus, J.A. [Abstract] [PDF]; Masse, L. [Abstract] [PDF]; Masse, L. [Abstract] [PDF]; McBride, A. D. [Abstract] [PDF]; Miller, W.W. [Abstract] [PDF]; Miller-Goodman, M. S. [Abstract] [PDF]; Moolenaar, S.W. [Abstract] [PDF]; Moore, Barry C. [Abstract] [PDF]; Moore, R. C. [Abstract] [PDF]; Moorman, T. B. [Abstract] [PDF]
O: Ohno, Tsutomu [Abstract] [PDF]; Olness, Alan [PDF]
P: Paramasivam, S. [Abstract] [PDF]; Parkes, M. E. [Abstract] [PDF]; Patni, N. K. [Abstract] [PDF]; Patni, N. K. [Abstract] [PDF]; Pierce, B.L. [Abstract] [PDF]; Pinney, David A. K. [Abstract] [PDF]
Q: Quemada, M. [Abstract] [PDF]
R: Redente, E.F. [Abstract] [PDF]; Ressler, D. E. [Abstract] [PDF]; Riley, M. B. [Abstract] [PDF]; Roy, William R. [PDF]
S: Schaumloffel, John C. [Abstract] [PDF]; Sharpley, Andrew N. [PDF]; Sheng, Guangyao [Abstract] [PDF]; Sheppard, S.C. (Steve) [PDF]; Skaggs, R. W. [Abstract] [PDF]; Stucki, Joseph W. [Abstract] [PDF]
T: Tambone, Fulvia [Abstract] [PDF]
V: VanCuren, Tony [Abstract] [PDF]; VanCuren, Tony [Abstract] [PDF]; Vaughn, David L. [Abstract] [PDF]; Vaughn, David L. [Abstract] [PDF]
W: Waalkens, A. [Abstract] [PDF]; Wang, Dong [Abstract] [PDF]; Wang, Dong [PDF]; Wang, Xiaorong [Abstract] [PDF]; Watson, M. E. [PDF]; Weed, D. A. J. [Abstract] [PDF]; Westfall, D. G. [Abstract] [PDF]; Whitwell, T. [Abstract] [PDF]; Wu, Shunnian [Abstract] [PDF]
X: Xue, Yuan [Abstract] [PDF]
Y: Yates, S. R. [Abstract] [PDF]; Yates, S.R. [PDF]
Z: Zink, Tom [Abstract] [PDF]

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